第一原理計算による半導体の系統的物性予測とin silicoスクリーニング
(Systematic prediction of fundamental properties of semiconductors and in silico screening using first-principles calculations)
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2020-11-20 10:35:43 +0900 Updated at: 2026-10-08 08:29:07 +0900