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Fluorescence Yield XANES Measurement of Thin Film by Silicon-Drift Detector
(シリコンドリフト検出器を用いた蛍光収量法による薄膜のX線吸収端近傍構造測定)

MURATA, Hidenobu, OKADA Keitaro, KOBAYASHI Daisuke, HIROSE Kazuyuki, YAMAMOTO Tomoyuki.

UVSOR Activity Report 41 52-52. 2014.

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2020-11-20 10:41:08 +0900 Updated at: 2020-11-20 10:41:08 +0900

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