In situ electrical measurements and manipulation of B/N-dopped C nanotubes in a high-resolution transmission electron microscope | SAMURAI, NIMS Researchers Directory Service

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In situ electrical measurements and manipulation of B/N-dopped C nanotubes in a high-resolution transmission electron microscope
(Cをド－プしたBNナノチューブのTEMによる電気特性評価)

GOLBERG, Dmitri, MITOME, Masanori, KURASHIMA, Keiji, BANDO, Yoshio.

JOURNAL OF ELECTRON MICROSCOPY 52 [2] 111-117. 2003.

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2020-11-20 10:40:32 +0900 Updated at: 2020-11-20 10:40:32 +0900

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