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Fourier Analysis of Interference Structure Observed in X-Ray Specular Reflection from Thin Films.
(全反射干渉パターンのフーリエ解析.)

桜井健次, 飯田厚夫, 飯田厚夫.

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    Fulltext and dataset(s) on Materials Data Repository (MDR)


      Created at: 2022-09-05 10:34:15 +0900 Updated at: 2022-09-05 10:34:15 +0900

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