HOME > その他の文献 > 書誌詳細Strain Field under the SiO2/Si(001) Interface Revealed by the Phase-sensitive X-ray Diffraction TechniqueYASHIRO, Wataru, MIKI, Kazushi, 高橋敏男. The Institute for Solid State Physics University of Tokyo Activity Report 2003 43-44. 2004.NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2020-11-20 10:40:06 +0900 更新時刻: 2020-11-20 10:40:06 +0900
