HOME > Books > DetailPower-Aware Testing and Test Strategies for Low Power DevicesPatrick Girard, Nicola Nicolici, Xiaoqing Wen. /books?q=book_title_text%3A%22%22 . 2010.NIMS author(s)Fulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2019-03-20 11:53:30 +0900 Updated at: 2019-03-20 11:53:30 +0900