Nanoscale Chemical Analysis in Various Interfaces with Energy Dispersive X-Ray Spectroscopy and Transmission Electron Microscopy | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Nanoscale Chemical Analysis in Various Interfaces with Energy Dispersive X-Ray Spectroscopy and Transmission Electron Microscopy

Seiichiro Ii.

X-RAY SPECTROSCOPY 265-280. 2012.

https://doi.org/10.5772/31645

NIMS著者

Materials Data Repository (MDR)上の本文・データセット

作成時刻: 2017-02-14 11:22:18 +0900更新時刻: 2024-03-31 12:30:24 +0900

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