Characterization of Thin Plate Bi-Based Superconductors by EPMA and Scanning X-Ray Diffracto-Microscope | SAMURAI, NIMS Researchers Directory Service

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Characterization of Thin Plate Bi-Based Superconductors by EPMA and Scanning X-Ray Diffracto-Microscope

雪野健, 末野重穂, 小松啓.

Chemical Designing and Processing of High Tc Superconductors 133-138. 1993.

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2022-09-05 10:36:48 +0900 Updated at: 2023-04-09 14:56:27 +0900

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