HOME > 書籍 > 書誌詳細Scanning Transmission Electron MicroscopyKoji Kimoto. Compendium of Surface and Interface Analysis 587-592. 2018.https://doi.org/10.1007/978-981-10-6156-1_95 NIMS著者木本 浩司Materials Data Repository (MDR)上の本文・データセット作成時刻: 2018-05-08 20:47:05 +0900 更新時刻: 2026-10-03 04:25:06 +0900
