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Last updated: October 22, 2026

2 article(s) found. Sorted by publication dates. (Help)
YOSHITAKE, Michiko, 吉原一紘, 吉原一紘. The effect of X-ray scanning on intensity and binding energy of photoelectron peak and the line scanning analysis of an etched c. Journal of suface Analysis. 5 [2] (1999) 258-261
陳清, 田中美代子, 古屋一夫. Deposition and HREM analysis of indim nenocmystals on Si surface using a UHV MBE TEM system. Journal of Suface Analysis. ()