Experimental verification of the surface termination in the topological insulator TlBiSe2using core-level photoelectron spectroscopy and scanning tunneling microscopy

Kenta Kuroda; Mao Ye; Eike F. Schwier; Munisa Nurmamat; Kaito Shirai; Masashi Nakatake; Shigenori Ueda; Koji Miyamoto; Taichi Okuda; Hirofumi Namatame; Masaki Taniguchi; Yoshifumi Ueda; Akio Kimura

doi:10.1103/physrevb.88.245308

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Experimental verification of the surface termination in the topological insulator TlBiSe2using core-level photoelectron spectroscopy and scanning tunneling microscopy
(Experimental verification of the surface termination in the topological insulator TlBiSe2using core-level photoelectron spectroscopy and scanning tunneling microscopy)

Kenta Kuroda, Mao Ye, Eike F. Schwier, Munisa Nurmamat, Kaito Shirai, Masashi Nakatake, Shigenori Ueda, Koji Miyamoto, Taichi Okuda, Hirofumi Namatame, Masaki Taniguchi, Yoshifumi Ueda, Akio Kimura.

Physical Review B 88 [24] 245308. 2013.

https://doi.org/10.1103/physrevb.88.245308

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上田茂典

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作成時刻: 2016-05-24 17:13:42 +0900更新時刻: 2024-03-31 11:47:13 +0900