Imaging properties of bright-field and annular-dark-field scanning confocal electron microscopy: II. Point spread function analysis | SAMURAI, NIMS Researchers Directory Service

Scheduled downtime (October 31st and November 1st, 2026) (2026-10-29)

HOME > Article > Detail

Imaging properties of bright-field and annular-dark-field scanning confocal electron microscopy: II. Point spread function analysis

K. Mitsuishi, A. Hashimoto, M. Takeguchi, M. Shimojo, K. Ishizuka.

Ultramicroscopy 112 [1] 53-60. 2012.

https://doi.org/10.1016/j.ultramic.2011.10.004

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2016-05-24 16:33:15 +0900 Updated at: 2026-10-08 06:43:12 +0900

▲ Go to the top of this page