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UHV-DC-TEMを用いたIn粒子の原子レベル構造観察とフラクチュエーションの解析
(Unusual crystallographic structure and its fluctuation of indium nanoparticles as-deposited and observed with HRTEM using the UHV-DC-TEM system)

陳清, 田中美代子, 古屋一夫, Q. Chen, M. Tanaka, K. Furuya.
Surface Science 440 [3] 398-406. 1999.

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