Molecular alignments studied by X-ray diffraction analysis and optical properties of vacuum-deposited thin films of thiophene-pyridine co-oligomers | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Molecular alignments studied by X-ray diffraction analysis and optical properties of vacuum-deposited thin films of thiophene-pyridine co-oligomers

Kumagai, A, Fujiwara, Y, Fukumoto, H, Sasaki, S, KOINUMA, Hideomi, Yamamoto, T.

JAPANESE JOURNAL OF APPLIED PHYSICS 45 [20-23] L598-L601. 2006.

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作成時刻: 2016-05-24 15:13:12 +0900 更新時刻: 2018-12-15 00:54:54 +0900

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