原子的に平坦化されたSi(111)表面へのCu ナノ細線の形成と原子間力顕微鏡およびフーリエ変換赤外分光法による評価
(Formation of Cu Nanowires on Atomically Flattened Si(111) Surface Studied by Atomic Force Microscopy and Fourier Transform Infrared Spectroscopy)
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2016-05-24 14:56:37 +0900 Updated at: 2018-12-15 01:00:37 +0900