Characterization of amorphous and crystalline silicon nanoclusters in ultra thin silica layers

Characterization of amorphous and crystalline silicon nanoclusters in ultra thin silica layers
(超薄シリカ膜中のアモルファスおよび結晶質シリコンナノクラスターの分析)

Annett Thogersen, Jeyanthinath Mayandi, Terje G. Finstad, Arne Olsen, Jens Sherman Christensen, Masanori Mitome, Yoshio Bando.

Created at: 2016-05-24 15:37:44 +0900Updated at: 2024-04-30 04:25:53 +0900