HOME > 論文 > 書誌詳細Wavelength dispersive X-ray spectroscopy of thick and thin samples for electron microscopesTANAKA, Miyoko, TAKEGUCHI, Masaki, FURUYA, Kazuo. SURFACE AND INTERFACE ANALYSIS 1684-1687. 2008.NIMS著者田中 美代子竹口 雅樹Materials Data Repository (MDR)上の本文・データセット作成時刻: 2022-10-21 22:33:28 +0900更新時刻: 2022-10-21 22:33:28 +0900
