Defect and dopant complex mediated high power factor in transparent selenium-doped copper iodide thin films

Peter P. Murmu; Martin Markwitz; Shen V. Chong; Niall Malone; Takao Mori; Himanshu Vyas; L. John Kennedy; Sergey Rubanov; Clastinrusselraj Indirathankam Sathish; Jiabao Yi; John V. Kennedy; Peter P. Murmu; Martin Markwitz; Shen V. Chong; Niall Malone; Takao Mori; Himanshu Vyas; L. John Kennedy; Sergey Rubanov; Clastinrusselraj Indirathankam Sathish; Jiabao Yi; John V. Kennedy

doi:10.1016/j.mtener.2024.101639

Defect and dopant complex mediated high power factor in transparent selenium-doped copper iodide thin films

Peter P. Murmu, Martin Markwitz, Shen V. Chong, Niall Malone, Takao Mori, Himanshu Vyas, L. John Kennedy, Sergey Rubanov, Clastinrusselraj Indirathankam Sathish, Jiabao Yi, John V. Kennedy.

Materials Today Energy 44 101639. 2024.

https://doi.org/10.1016/j.mtener.2024.101639

Open Access Elsevier BV (Publisher) Materials Data Repository (MDR)

NIMS author(s)

MORI, Takao

Fulltext and dataset(s) on Materials Data Repository (MDR)

MDRavailable Defect and dopant complex mediated high power factor in transparent selenium-doped copper iodide thin films

Created at: 2024-07-30 09:22:36 +0900 Updated at: 2026-09-25 04:31:02 +0900