Electronic structure characterization of La2NiMnO6 epitaxial thin films using synchrotron-radiation photoelectron spectroscopy and optical spectroscopy | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Electronic structure characterization of La2NiMnO6 epitaxial thin films using synchrotron-radiation photoelectron spectroscopy and optical spectroscopy

M. Kitamura, I. Ohkubo, M. Matsunami, K. Horiba, H. Kumigashira, Y. Matsumoto, H. Koinuma, M. Oshima.

Applied Physics Letters 94 [26] 262503. 2009.

https://doi.org/10.1063/1.3159826

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作成時刻: 2016-05-24 16:04:32 +0900 更新時刻: 2026-10-30 08:57:11 +0900

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