HOME > 論文 > 書誌詳細In Situ TEM-STM Recorded Kinetics of Boron Nitride Nanotube Failure under Current FlowZhi Xu, Dmitri Golberg, Yoshio Bando. Nano Letters 9 [6] 2251-2254. 2009.https://doi.org/10.1021/nl900379c NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 15:50:49 +0900更新時刻: 2024-11-14 07:14:43 +0900
