Micro-imaging of buried layers and interfaces in ultrathin films by X-ray reflectivity
(Micro-imaging of buried layers and interfaces in ultrathin films by X-ray reflectivity )
NIMS著者
Materials Data Repository (MDR)上の本文・データセット
作成時刻: 2016-10-26 15:44:20 +0900 更新時刻: 2026-10-29 04:23:57 +0900