Electronic transitions in CePd2Si2studied by resonant x-ray emission spectroscopy at high pressures and low temperatures

Hitoshi Yamaoka; Yumiko Zekko; Akio Kotani; Ignace Jarrige; Naohito Tsujii; Jung-Fu Lin; Jun'ichiro Mizuki; Hideki Abe; Hideaki Kitazawa; Nozomu Hiraoka; Hirofumi Ishii; Ku-Ding Tsuei

doi:10.1103/physrevb.86.235131

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Electronic transitions in CePd2Si2studied by resonant x-ray emission spectroscopy at high pressures and low temperatures
(Electronic transitions in CePd2Si2studied by resonant x-ray emission spectroscopy at high pressures and low temperatures)

Hitoshi Yamaoka, Yumiko Zekko, Akio Kotani, Ignace Jarrige, Naohito Tsujii, Jung-Fu Lin, Jun'ichiro Mizuki, Hideki Abe, Hideaki Kitazawa, Nozomu Hiraoka, Hirofumi Ishii, Ku-Ding Tsuei.

Physical Review B 86 [23] 235131. 2012.

https://doi.org/10.1103/physrevb.86.235131

NIMS著者

Materials Data Repository (MDR)上の本文・データセット

作成時刻: 2016-05-24 16:48:01 +0900更新時刻: 2024-04-02 03:18:01 +0900

Electronic transitions in CePd2Si2studied by resonant x-ray emission spectroscopy at high pressures and low temperatures(Electronic transitions in CePd2Si2studied by resonant x-ray emission spectroscopy at high pressures and low temperatures)

NIMS著者

Materials Data Repository (MDR)上の本文・データセット

Electronic transitions in CePd2Si2studied by resonant x-ray emission spectroscopy at high pressures and low temperatures
(Electronic transitions in CePd2Si2studied by resonant x-ray emission spectroscopy at high pressures and low temperatures)