HOME > Article > DetailDiagnosis of low-frequency noise sources in contact resistance of staggered organic transistorsY. Xu, R. Gwoziecki, R. Coppard, M. Benwadih, T. Minari, K. Tsukagoshi, J. A. Chroboczek, F. Balestra, G. Ghibaudo. Applied Physics Letters 98 [3] 033505. 2011.https://doi.org/10.1063/1.3544583 NIMS author(s)Fulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 16:19:10 +0900 Updated at: 2026-10-30 07:28:05 +0900
