HOME > 論文 > 書誌詳細Diagnosis of low-frequency noise sources in contact resistance of staggered organic transistorsY. Xu, R. Gwoziecki, R. Coppard, M. Benwadih, T. Minari, K. Tsukagoshi, J. A. Chroboczek, F. Balestra, G. Ghibaudo. Applied Physics Letters 98 [3] 033505. 2011.https://doi.org/10.1063/1.3544583 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 16:19:10 +0900更新時刻: 2024-03-31 14:42:27 +0900
