HOME > 論文 > 書誌詳細Generalized mechanism of the resistance switching in binary-oxide-based resistive random-access memoriesKatsumasa Kamiya, Moon Young Yang, Takahiro Nagata, Seong-Geon Park, Blanka Magyari-Köpe, Toyohiro Chikyow, Keisaku Yamada, Masaaki Niwa, Yoshio Nishi, Kenji Shiraishi. Physical Review B 87 [15] 155201. 2013.https://doi.org/10.1103/physrevb.87.155201 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 17:12:48 +0900更新時刻: 2024-04-02 04:08:09 +0900