HOME > Article > DetailCharacterization of ion-beam-induced amorphous structures by advanced electron microscopyManabu Ishimaru, In-Tae Bae, Tadakatsu Ohkubo, Yoshihiko Hirotsu, Kurt E. Sickafus. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 190 [1-4] 882-886. 2002.https://doi.org/10.1016/s0168-583x(01)01223-x NIMS author(s)OHKUBO, TadakatsuFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 11:55:20 +0900 Updated at: 2026-10-03 06:26:09 +0900
