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Analysis of Stoichmetry of high-Tc superconducting films by RBS and PIXE methods
(RBS及びPIXE法による高温超伝導薄膜の組成分析)

R.Sandrik, V.Bohac, 中村恵吉, A. Ishii, R. Šandrik, M. Jergel, V. Štrbik, K. Nakamura, I. Orlic, S.M. Tang, F. Watt.
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 118 [1-4] 602-607. 1996.
https://doi.org/10.1016/0168-583x(95)01078-5

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