Characterisation of WO3-,V2O5-,and P2O5-doped bismuth oxides by X-ray diffraction and raman spectroscopy | SAMURAI, NIMS Researchers Directory Service

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Characterisation of WO3-,V2O5-,and P2O5-doped bismuth oxides by X-ray diffraction and raman spectroscopy

G.A.Tompsett, N.M.Sammes, Y.Zhang, 渡辺昭輝.

Solid State Ionics 113-115. 1998.

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Created at: 2022-09-05 10:55:46 +0900 Updated at: 2022-09-05 10:55:46 +0900

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