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Effects of moisture and redox reactions in VCM and ECM resistive switching memories

Ilia Valov, TSURUOKA, Tohru.
JOURNAL OF PHYSICS D-APPLIED PHYSICS [41] 413001-1-413001-18. 2018.

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    Created at: 2019-03-04 09:35:47 +0900Updated at: 2019-05-10 18:54:51 +0900

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