Effects of moisture and redox reactions in VCM and ECM resistive switching memories
| Author(s) | Ilia Valov, TSURUOKA, Tohru. |
|---|---|
| Journal title | JOURNAL OF PHYSICS D-APPLIED PHYSICS [41] 413001-1-413001-18 |
| Publisher | |
| Year of publication | 2018 |
| Language | English |