HOME > 論文 > 書誌詳細Scanning Transmission Electron MicroscopyKoji Kimoto. Compendium of Surface and Interface Analysis 587-592. 2018.https://doi.org/10.1007/978-981-10-6156-1_95 NIMS著者木本 浩司Materials Data Repository (MDR)上の本文・データセット作成時刻: 2018-05-04 20:41:53 +0900更新時刻: 2025-02-14 04:26:14 +0900