Chemical State Mapping by X-Ray Fluorescence Using Absorption Edge Shifts.
(選択励起蛍光X線分析法による化学状態マッピング.)
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2016-05-24 11:30:24 +0900 Updated at: 2018-12-14 23:52:43 +0900