Formation and disruption of current paths of anodic porous alumina films by conducting atomic force microscopy | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Formation and disruption of current paths of anodic porous alumina films by conducting atomic force microscopy
(陽極酸化アルミナ膜の電流経路の形成と破壊)

K. Oyoshi, S. Nigo, J. Inoue, O. Sakai, H. Kitazawa, G. Kido.

Applied Surface Science 257 [3] 837-841. 2010.

https://doi.org/10.1016/j.apsusc.2010.07.076

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作成時刻: 2016-05-24 16:03:30 +0900 更新時刻: 2026-10-08 07:35:22 +0900

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