Melting curve of silicon to 15GPa determined by two-dimensional angle-dispersive diffraction using a Kawai-type apparatus with X-ray transparent sintered diamond anvils
(Melting curve of silicon to 15 GPa determined by two-dimensional angle-dispersive diffraction using a Kawai-type apparatus with X-ray transparent sintered diamond anvils)
NIMS著者
Materials Data Repository (MDR)上の本文・データセット
作成時刻: 2025-10-09 16:29:09 +0900 更新時刻: 2026-10-22 04:32:58 +0900