Melting curve of silicon to 15GPa determined by two-dimensional angle-dispersive diffraction using a Kawai-type apparatus with X-ray transparent sintered diamond anvils
(Melting curve of silicon to 15 GPa determined by two-dimensional angle-dispersive diffraction using a Kawai-type apparatus with X-ray transparent sintered diamond anvils)
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Created at: 2025-10-09 16:29:09 +0900 Updated at: 2026-10-22 04:32:58 +0900