Sputtering of C-60 fullerenes physisorbed on Ar, Xe, H2O, O-2, and C8F18 matrix films studied with time-of-flight secondary ion mass spectrometry | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Sputtering of C-60 fullerenes physisorbed on Ar, Xe, H2O, O-2, and C8F18 matrix films studied with time-of-flight secondary ion mass spectrometry

The Journal of Physical Chemistry A 111 [2] 201-205. 2007.

https://doi.org/10.1021/jp0647535

NIMS著者

左右田龍太郎

Materials Data Repository (MDR)上の本文・データセット

作成時刻: 2016-05-24 15:12:52 +0900更新時刻: 2024-04-01 19:51:52 +0900

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