Atomic-scale distortion of optically activated Sm dopants identified with site-selective X-ray absorption spectroscopy | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Atomic-scale distortion of optically activated Sm dopants identified with site-selective X-ray absorption spectroscopy
(サイト選択XAFSによる光学活性Sm不純物の原子歪構造の特定)

Masashi Ishii, Iain F. Crowe, Matthew P. Halsall, Bruce Hamilton, Yongfeng Hu, Tsun-Kong Sham, Susumu Harako, Xin-Wei Zhao, Shuji Komuro.

Journal of Applied Physics 114 [13] 133505. 2013.

https://doi.org/10.1063/1.4824375

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作成時刻: 2016-05-24 17:10:02 +0900 更新時刻: 2026-08-28 07:38:12 +0900

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