HOME > 論文 > 書誌詳細Electronic structural analysis of transparent In2O3-ZnO films by hard X-ray photoelectron spectroscopyTadao Shibuya, Masahiro Yoshinaka, Yukio Shimane, Futoshi Utsuno, Koki Yano, Kazuyoshi Inoue, Eiji Ikenagab, Jung J. Kim, Shigenori Ueda, Masaaki Obata, Keisuke Kobayashi. Thin Solid Films 518 [11] 3008-3011. 2010.https://doi.org/10.1016/j.tsf.2009.09.170 NIMS著者上田 茂典Materials Data Repository (MDR)上の本文・データセット作成時刻 :2018-06-08 21:30:06 +0900 更新時刻 :2020-11-16 23:19:45 +0900