Tadao Shibuya; Masahiro Yoshinaka; Yukio Shimane; Futoshi Utsuno; Koki Yano; Kazuyoshi Inoue; Eiji Ikenagab; Jung J. Kim; Shigenori Ueda; Masaaki Obata; Keisuke Kobayashi

doi:10.1016/j.tsf.2009.09.170

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Electronic structural analysis of transparent In2O3-ZnO films by hard X-ray photoelectron spectroscopy

Tadao Shibuya, Masahiro Yoshinaka, Yukio Shimane, Futoshi Utsuno, Koki Yano, Kazuyoshi Inoue, Eiji Ikenagab, Jung J. Kim, Shigenori Ueda, Masaaki Obata, Keisuke Kobayashi.

Thin Solid Films 518 [11] 3008-3011. 2010.

https://doi.org/10.1016/j.tsf.2009.09.170

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上田茂典

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作成時刻: 2018-06-08 21:30:06 +0900更新時刻: 2024-11-11 04:56:48 +0900