Raman spectroscopic characterization of tetragonal PbZrxTi1-xO3 thin films: A rapid evaluation method for c-domain volume | SAMURAI, NIMS Researchers Directory Service

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Raman spectroscopic characterization of tetragonal PbZrxTi1-xO3 thin films: A rapid evaluation method for c-domain volume

西田謙, OSADA, Minoru, 和田俊介, 岡本庄司, 上野梨紗子, 舟窪浩, 河東田隆.

JAPANESE JOURNAL OF APPLIED PHYSICS 44 [24-27] L827-L829. 2005.

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Created at: 2016-05-24 14:44:47 +0900 Updated at: 2018-12-15 01:29:38 +0900

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