In situ observation of Pt nanoparticles on graphene layers under high temperature using aberration-corrected transmission electron microscopy | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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In situ observation of Pt nanoparticles on graphene layers under high temperature using aberration-corrected transmission electron microscopy

Ayako Hashimoto, Masaki Takeguchi.

Microscopy 61 [6] 409-413. 2012.

https://doi.org/10.1093/jmicro/dfs060

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作成時刻: 2016-05-24 16:47:56 +0900更新時刻: 2024-04-02 03:20:43 +0900

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