Atomic resolution imaging of a single-crystal Cu(100) surface by scanning tunneling microscopy in ultrahigh vacuum at room tempe | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Atomic resolution imaging of a single-crystal Cu(100) surface by scanning tunneling microscopy in ultrahigh vacuum at room tempe
(STM によるCu(100)表面の原子分解能観測)

Z. Q. Zou, Z. C. Dong, A. S. Trifonov, H. Nejo.

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 20 [4] 1567. 2002.

https://doi.org/10.1116/1.1495903

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作成時刻: 2016-05-24 11:54:11 +0900 更新時刻: 2026-09-30 04:40:16 +0900

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