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著者名Chuan Liu, Changdong Chen, Xiaojie Li, Sujuan Hu, Chenning Liu, Kairong Huang, Fuhua Dai, Baijun Zhang, Xuying Liu, Takeo Minari, Yong‐Young Noh, Jun Chen.
タイトルA General Approach to Probe Dynamic Operation and Carrier Mobility in Field‐Effect Transistors with Nonuniform Accumulation
掲載誌名Advanced Functional Materials 29 [29] 1901700
ISSN: 1616301X
発表年2019
言語English
ESIでのカテゴリ
DOIhttps://doi.org/10.1002/adfm.201901700
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