A General Approach to Probe Dynamic Operation and Carrier Mobility in Field‐Effect Transistors with Nonuniform Accumulation

Chuan Liu; Changdong Chen; Xiaojie Li; Sujuan Hu; Chenning Liu; Kairong Huang; Fuhua Dai; Baijun Zhang; Xuying Liu; Takeo Minari; Yong‐Young Noh; Jun Chen

doi:10.1002/adfm.201901700

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A General Approach to Probe Dynamic Operation and Carrier Mobility in Field‐Effect Transistors with Nonuniform Accumulation

Chuan Liu, Changdong Chen, Xiaojie Li, Sujuan Hu, Chenning Liu, Kairong Huang, Fuhua Dai, Baijun Zhang, Xuying Liu, Takeo Minari, Yong‐Young Noh, Jun Chen.

Advanced Functional Materials 29 [29] 1901700. 2019.

https://doi.org/10.1002/adfm.201901700

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作成時刻: 2019-12-12 03:00:20 +0900更新時刻: 2024-03-31 01:06:19 +0900