HOME > 論文 > 書誌詳細Thickness-Dependent Interfacial Coulomb Scattering in Atomically Thin Field-Effect TransistorsSong-Lin Li, Katsunori Wakabayashi, Yong Xu, Shu Nakaharai, Katsuyoshi Komatsu, Wen-Wu Li, Yen-Fu Lin, Alex Aparecido-Ferreira, Kazuhito Tsukagoshi. Nano Letters 13 [8] 3546-3552. 2013.https://doi.org/10.1021/nl4010783 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 17:09:09 +0900更新時刻: 2024-11-07 06:48:18 +0900