Transmission electron microscopy study on the effect of various capping layers on CoFeB/MgO/CoFeB pseudo spin valves annealed at different temperatures | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Transmission electron microscopy study on the effect of various capping layers on CoFeB/MgO/CoFeB pseudo spin valves annealed at different temperatures

S. V. Karthik, Y. K. Takahashi, T. Ohkubo, K. Hono, H. D. Gan, S. Ikeda, H. Ohno.

Journal of Applied Physics 111 [8] 083922. 2012.

https://doi.org/10.1063/1.4707964

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作成時刻: 2016-05-24 16:54:54 +0900更新時刻: 2024-03-31 15:49:25 +0900

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