Ivan Gutierrez-Urrutia; Cheng-Lin Li; Xin Ji; Satoshi Emura; Koichi Tsuchiya

doi:10.1080/14686996.2018.1475824

Quantitative analysis of {332}〈113〉 twinning in a Ti-15Mo alloy by in situ scanning electron microscopy

著者	Ivan Gutierrez-Urrutia, Cheng-Lin Li, Xin Ji, Satoshi Emura, Koichi Tsuchiya.
掲載誌名	Science and Technology of Advanced Materials 19 [1] 474-483 ISSN: 14686996 ESIでのカテゴリ: MATERIALS SCIENCE
出版社	Informa UK Limited
発表年	2018
言語	English
DOI	https://doi.org/10.1080/14686996.2018.1475824
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