HOME > 論文 > 書誌詳細Hard X-ray photoemission spectroscopy: Variable depth analysis of bulk, surface and interface electronic propertiesGiancarlo Panaccione, Keisuke Kobayashi. Surface Science 606 [3-4] 125-129. 2012.https://doi.org/10.1016/j.susc.2011.10.022 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 17:03:15 +0900 更新時刻: 2026-10-30 06:52:20 +0900
