High-resolution transmission electron microscopy study of interface structure and strain in epitaxial β-FeSi2 on Si (111) substrate
(Si(111)基板上エピタキシャルbeta-FeSi2の界面構造と歪みの高分解能電子顕微鏡監察)
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2016-05-24 11:56:16 +0900 Updated at: 2026-10-08 07:47:29 +0900