Raman Spectroscopy Evaluation of Oxygen Vacancy Migration by Electrical Field in Multilayer Ceramic Capacitors | SAMURAI, NIMS Researchers Directory Service

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Raman Spectroscopy Evaluation of Oxygen Vacancy Migration by Electrical Field in Multilayer Ceramic Capacitors

Ken Nishida, Hiroshi Kishi, OSADA, Minoru, Hiroshi Funakubo, Masamichi Nishide, Hironari Takeuchi, Takashi Katouda, Takashi Yamamoto.

JAPANESE JOURNAL OF APPLIED PHYSICS 09KF11-1-09KF11-4. 2009.

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2022-10-21 23:02:31 +0900 Updated at: 2022-10-21 23:02:31 +0900

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