Tuning THz emission properties of Bi2Sr2CaCu2O8+δintrinsic Josephson junction stacks by charge carrier injection

O Kizilaslan; F Rudau; R Wieland; J S Hampp; X J Zhou; M Ji; O Kiselev; N Kinev; Y Huang; L Y Hao; A Ishii; M A Aksan; T Hatano; V P Koshelets; P H Wu; H B Wang; D Koelle; R Kleiner; O Kizilaslan; F Rudau; R Wieland; J S Hampp; X J Zhou; M Ji; O Kiselev; N Kinev; Y Huang; L Y Hao; A Ishii; M A Aksan; T Hatano; V P Koshelets; P H Wu; H B Wang; D Koelle; R Kleiner

doi:10.1088/1361-6668/aa55ae

Tuning THz emission properties of Bi2Sr2CaCu2O8+δintrinsic Josephson junction stacks by charge carrier injection

O Kizilaslan, F Rudau, R Wieland, J S Hampp, X J Zhou, M Ji, O Kiselev, N Kinev, Y Huang, L Y Hao, A Ishii, M A Aksan, T Hatano, V P Koshelets, P H Wu, H B Wang, D Koelle, R Kleiner.

Superconductor Science and Technology 30 [3] 034006. 2017.

https://doi.org/10.1088/1361-6668/aa55ae

NIMS author(s)

HATANO, Takeshi

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2017-12-16 20:47:11 +0900Updated at: 2024-04-01 22:48:13 +0900