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Tunnel magnetoresistance properties and film structures of double MgO barrier magnetic tunnel junctions

H. D. Gan, S. Ikeda, W. Shiga, J. Hayakawa, K. Miura, H. Yamamoto, H. Hasegawa, F. Matsukura, T. Ohkubo, K. Hono, H. Ohno.
Applied Physics Letters 96 [19] 192507. 2010.
https://doi.org/10.1063/1.3429594

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