HOME > 論文 > 書誌詳細Coordination and interface analysis of atomic-layer-deposition Al2O3 on Si(001) using energy-loss near-edge structures(EELSによるAl2O3/Si界面の化学結合状態の解析)K. Kimoto, Y. Matsui, T. Nabatame, T. Yasuda, T. Mizoguchi, I. Tanaka, A. Toriumi. Applied Physics Letters 83 [21] 4306-4308. 2003.https://doi.org/10.1063/1.1629397 NIMS著者木本 浩司Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 12:00:27 +0900 更新時刻: 2026-09-26 04:15:22 +0900