HOME > Article > DetailLaser assisted atom probe analysis of thin film on insulating substrate(絶縁性基板上の薄膜のレーザー補助アトムプローブ解析)M. Kodzuka, T. Ohkubo, K. Hono. Ultramicroscopy 111 [6] 557-561. 2011.https://doi.org/10.1016/j.ultramic.2010.11.008 NIMS author(s)OHKUBO, TadakatsuHONO, KazuhiroFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2018-06-08 21:04:32 +0900Updated at: 2024-05-02 09:55:05 +0900