Local variations in the critical current degradation of Ag/Bi2223 tape by tensile and bending strains | SAMURAI, NIMS Researchers Directory Service

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Local variations in the critical current degradation of Ag/Bi2223 tape by tensile and bending strains
(引張り及び曲げ歪みによるAg/Bi2223テープ材の臨界電流の劣化)

片桐一宗, 笠場友和, 筑城沢友和, Hyung-Seop Shin, KURODA, Tsuneo, ITOH, Kikuo, WADA, Hitoshi.

SUPERCONDUCTOR SCIENCE & TECHNOLOGY 995-999. 2003.

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2022-11-15 00:40:43 +0900 Updated at: 2022-11-15 00:40:43 +0900

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